5 results
Mapping Polar Distortions with Nanobeam Electron Diffraction with a Cepstral Approach
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 468-469
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- August 2022
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Structural Characterization of Powders and Thin Films of Layered Li1.2Mn0.55Ni0.15Co0.1O2 Cathode Materials
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 145-146
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- August 2015
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Fabrication of Self-Supporting Annular Apertures for Use in the Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1949-1950
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- August 2015
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Low Angle Annular Dark Field Scanning Transmission Electron Microscopy is Sensitive to Oxidation State in CeO2 Nanoparticles
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 239-240
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- August 2015
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Characterization of a Layered Lithium Manganese-rich Oxide Cathode Material via Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 498-499
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- August 2014
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